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Home » Product » QFP80 TQFP80 QFP11T080 005 Burn in Socket gold plating IC testing QFP80 0.65mm Pitch 12*12mm+14*14mm seat Test Socket test bench-in Semiconductors from Electronic Components & Supplies

QFP80 TQFP80 QFP11T080 005 Burn in Socket gold plating IC testing QFP80 0.65mm Pitch 12*12mm+14*14mm seat Test Socket test bench-in Semiconductors from Electronic Components & Supplies

QFP80 TQFP80 QFP11T080 005 Burn in Socket gold plating IC testing QFP80 0.65mm Pitch 12*12mm+14*14mm seat Test Socket test bench-in Semiconductors from Electronic Components & Supplies

US $ 70.88 US $ (Disc 0%)

Category : Electronic Components Supplies


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Details about product QFP80 TQFP80 QFP11T080 005 Burn in Socket gold plating IC testing QFP80 0.65mm Pitch 12*12mm+14*14mm seat Test Socket test bench-in Semiconductors from Electronic Components & Supplies are here :

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Image 1 - QFP80 TQFP80 QFP11T080 005 Burn in Socket gold plating IC testing QFP80 0.65mm Pitch 12*12mm+14*14mm seat Test Socket test bench-in Semiconductors from Electronic Components & Supplies Image 2 - QFP80 TQFP80 QFP11T080 005 Burn in Socket gold plating IC testing QFP80 0.65mm Pitch 12*12mm+14*14mm seat Test Socket test bench-in Semiconductors from Electronic Components & Supplies Image 3 - QFP80 TQFP80 QFP11T080 005 Burn in Socket gold plating IC testing QFP80 0.65mm Pitch 12*12mm+14*14mm seat Test Socket test bench-in Semiconductors from Electronic Components & Supplies Image 4 - QFP80 TQFP80 QFP11T080 005 Burn in Socket gold plating IC testing QFP80 0.65mm Pitch 12*12mm+14*14mm seat Test Socket test bench-in Semiconductors from Electronic Components & Supplies Image 5 - QFP80 TQFP80 QFP11T080 005 Burn in Socket gold plating IC testing QFP80 0.65mm Pitch 12*12mm+14*14mm seat Test Socket test bench-in Semiconductors from Electronic Components & Supplies Image 5 - QFP80 TQFP80 QFP11T080 005 Burn in Socket gold plating IC testing QFP80 0.65mm Pitch 12*12mm+14*14mm seat Test Socket test bench-in Semiconductors from Electronic Components & Supplies

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